Onto Innovation
Nanospec 9300 Film Analysis
Provisional entry — research in progress
This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.
The Nanospec 9300 Film Analysis is a thin film thickness measurement tool. The Nanospec 9300 Film Analysis is a spectroscopic reflectometer. The Nanospec 9300 Film Analysis is currently configured for 12" wafers.[1]
What it is
Applications
The Nanospec 9300 is used for thin-film thickness measurement.[1]
What do the numbers mean?
Power & electrical1
Wafer handling3
Optics & imaging3
Control & software2
- Metrology software
- Windows XP-based N2000 metrology software (Version N2000 4.2.90 Beta)[1]2 sources
Configuration & options9
What does it need to run?
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
- Input power208 VAC, 18 A, 50/60 Hz[1]
Where are the manuals?
Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.
Not publicly documented
Field notes
No research found yet — worked with this tool? Share what you know.
Frequently asked questions
Not publicly documented
The following facts about the Nanospec 9300 Film Analysis are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nanospec 9300 Film Analysis are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Nanospec 9300 Film Analysis are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Nanospec 9300 Film Analysis are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Nanospec 9300 Film Analysis are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Nanospec 9300 Film Analysis is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No research found yet — worked with this tool? Share what you know.
Sources & citations
Sources (3)Every fact above is drawn from these public sources
- [1]wotol.com — wotol.comwotol.com
- [2]Inventory photo
- [3]waferpedia.com — waferpedia.comwaferpedia.com
Last updated Oct 8, 2026.
Compare with similar tools
View all →The ABM-407B-2-S-CE-S293 is a robot.