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Filmetrics

R50

FilmetricsR50
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What it is

The Filmetrics R50 is a metrology and inspection tool used for film-thickness measurement. The CMi installation configures the tool by default for metallic layers and for sample thicknesses of 525 um plus or minus 25 um.[1]

Where it fits in the process flow

General reference — not yet source-verified

Metrology tools sit between fabrication steps that create a layer and later steps that depend on that layer being within specification. A thickness-measurement instrument supports process monitoring before pattern transfer, device assembly, or electrical test.

Applications

General reference — not yet source-verified

A thickness metrology system of this class is used for thin films on semiconductor and microfabrication samples. Such tools are applied to deposited conductors, dielectrics, and other layers when thickness and uniformity need to be checked.

  • metrology

What do the numbers mean?

Configuration & options7

Default configuration
configured by default for metallic layers[1]
Accurate?
Default sample thickness
525 um +/- 25 um[1]
Accurate?
Equipment section
Metrology[1]
Accurate?
Related equipment on same page group
AIT CMT-SR2000N 4-Point Probe Measurement System; MPI TS150 Probe Station[1]
Accurate?
Measurement type
4-point probe[1]
Accurate?
Default sample thickness
525 µm ± 25 µm[1]
Accurate?
Default material
metallic layers[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What is the Filmetrics R50 configured to measure by default?

The Filmetrics R50 is configured by default for metallic layers and for sample thicknesses of 525 um plus or minus 25 um.[1]

Not publicly documented

The following facts about the R50 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the R50 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the R50 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the R50 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the R50 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the R50 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]epfl.ch — epfl.chepfl.ch
  2. [2]AIT CMT-SR2000N 4-Point Probe Measurement System ‒ Center of MicroNanoTechnology CMi ‐ EPFL — epfl.chepfl.ch
  3. [3]MPI TS150 Probe Station ‒ Center of MicroNanoTechnology CMi ‐ EPFL — epfl.chepfl.ch
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Last updated Oct 4, 2026.

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