Eagle
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The Teradyne J750 is a semiconductor test platform for digital/mixed-signal, linear/power/automotive, microcontroller/image sensor/LCD driver, and RF/wireless devices. The J750 was first introduced in 1998. The J750 family has an installed base of over 6,000 test systems and is available at more than 50 OSAT locations.[1][2]
Produced
1998–
Power
400 MHz/800 Mbps[1]
Process applications and technology nodes documented for this tool.
The J750 was first introduced in 1998.
| Designation | Generation | Vintage | Changes | Source |
|---|---|---|---|---|
| J750Ex-HD | — | — | Latest offering with highest level of parallelism and performance; supports high density instruments, offers zero footprint design, and includes options like HSD800, MTO, DSSC, DSHRAM, HVD, HDDPS, HDVIS, MSO, HDCTO, HDAPMU. | teradyne.com[1] |
| J750-LitePoint | — | — | Adds LitePoint instrumentation for RF test, supports up to 32 RF ports, available as an upgrade for all J750 models (J750, Ex, HD). | teradyne.com[1] |
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The following facts about the J750 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
The control-system platform and OS era of the J750 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the J750 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the J750 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly documented compatible parts, consumables, or accessories for the J750 are on record.
Answerable by: an OEM parts catalog or a service engineer
No publicly hosted manuals, SOPs, or datasheets for the J750 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
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Last updated Oct 9, 2026.