Waferpedia

Tool family

Eagle J750

The Eagle J750 is a semiconductor test platform listed among Teradyne’s products for digital/mixed-signal, linear/power/automotive, microcontroller/image sensor/LCD driver, and RF/wireless applications.

Models in this family

  1. J750produced 1998–

    The Teradyne J750 is a semiconductor test platform for digital/mixed-signal, linear/power/automotive, microcontroller/image sensor/LCD driver, and RF/wireless devices.

    Cited variants

    DesignationGenerationVintageChangesSource
    J750Ex-HD——Latest offering with highest level of parallelism and performance; supports high density instruments, offers zero footprint design, and includes options like HSD800, MTO, DSSC, DSHRAM, HVD, HDDPS, HDVIS, MSO, HDCTO, HDAPMU.teradyne.com[1]
    J750-LitePoint——Adds LitePoint instrumentation for RF test, supports up to 32 RF ports, available as an upgrade for all J750 models (J750, Ex, HD).teradyne.com[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]teradyne.comteradyne.com