Comparison ledger
Agilent 11980 A, Wyko NT-2000, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 11980 AAgilent | NT-2000Wyko |
|---|---|---|
| OEM | Agilent | Wyko |
| Category | Precision Optics | Precision Optics |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Agilent 11980 A | Wyko NT-2000 |
| Specifications | ||
| Wavelength Range | 1250-1600 nm[1] | — |
| measurement type | — | non-contact surface metrology / optical profiling[2] |
| height measurement range | — | 0.1 nm to several millimeters[2] |
| vertical resolution | — | as low as 0.1 nm[2] |
| automation | — | fully automated production version available; non-automated versions available for R&D[2] |
| motion/stage features | — | high speed auto focus, auto turret, and computer-controlled stage[2] |
| analysis capability | — | 3-D surface analysis with powerful analysis software[2] |
| Measurement height range | — | 0.1 nm to several millimeters[2] |
| Measurement type | — | non-contact surface metrology[2] |
| Automation | — | fully automated; high speed auto focus, auto turret, computer-controlled stage[2] |
| Precision | — | submicron precision[2] |
| Field of view | — | large field-of-view area measurements[2] |
| Qualification | — | gage-qualified instrument[2] |
| Configurations | — | non-automated versions available for R&D applications[2] |
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