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Wyko

NT-2000

Precision OpticsWyko NT-2000 family
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The WYKO NT-2000 is an optical profiler that gives ultra-precise 3-D analyses of any surface for process control. The NT-2000 is a non-contact surface metrology system that rapidly measures heights from 0.1 nm to several millimeters. The NT-2000 has vertical resolution as low as 0.1 nm and is fully automated with high speed auto focus, auto turret and a computer-controlled stage.[1]

NT-2000 — web.archive.org
Fig. 01NT-2000web.archive.org[1]

Performance

submicron precision[1]

Optics

0.1 nm to several millimeters[1]

What it is

The Wyko NT-2000 is an optical profiler for non-contact surface metrology and process measurement.[1]

The Wyko NT-2000 is a 3-D surface analysis instrument for measuring surface height variations and supporting inspection, failure analysis, and production measurement.[1]

How it works

The Wyko NT-2000 uses optical surface profiling to measure surface heights without contact.[1]

The Wyko NT-2000 can be configured with high speed auto focus, an auto turret, and a computer-controlled stage for automated operation.[1]

Where it fits in the process flow

The Wyko NT-2000 fits in process control and inspection flows where surface measurements are needed during development, quality inspection, failure analysis, and production monitoring.[1]

The Wyko NT-2000 supports rapid, in-line production measurements and also has non-automated versions for research and development applications.[1]

Applications

The Wyko NT-2000 measures advanced materials, automotive parts, glass and ceramics, machined metal, micro-machined devices, paper, film, foil, printing plates, rolls, semiconductors, wet and dry thick film resistors, and printed circuit boards.[1]

The Wyko NT-2000 measures surface roughness and surface area on ceramics, glass, metal, paper, film, and foil.[2]

  • process control
  • R&D investigation
  • quality inspection
  • failure analysis
  • rapid in-line production measurements

What do the numbers mean?

Optics & imaging4

measurement type
non-contact surface metrology / optical profiling[1]
Accurate?
height measurement range
0.1 nm to several millimeters[1]
Accurate?
vertical resolution
as low as 0.1 nm[1]
Accurate?
Measurement height range
0.1 nm to several millimeters[1]
Accurate?

Performance1

Precision
submicron precision[1]
Accurate?

Control & software3

motion/stage features
high speed auto focus, auto turret, and computer-controlled stage[1]
Accurate?
analysis capability
3-D surface analysis with powerful analysis software[1]
Accurate?
Automation
fully automated; high speed auto focus, auto turret, computer-controlled stage[1]
Accurate?

Configuration & options5

automation
fully automated production version available; non-automated versions available for R&D[1]
Accurate?
Measurement type
non-contact surface metrology[1]
Accurate?
Field of view
large field-of-view area measurements[1]
Accurate?
Qualification
gage-qualified instrument[1]
Accurate?
Configurations
non-automated versions available for R&D applications[1]
Accurate?
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What replaced it?

Alternatives

Tools documented as functional equivalents — same process step and wafer size, from a different manufacturer. Each equivalence cites its source.

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What type of instrument is the Wyko NT-2000?

The Wyko NT-2000 is an optical profiler for non-contact surface metrology and process measurement.[1]

What kinds of measurements does the Wyko NT-2000 perform?

The Wyko NT-2000 rapidly measures surface heights from 0.1 nm to several millimeters and provides vertical resolution as low as 0.1 nm.[1]

What operating features are available on the Wyko NT-2000?

The Wyko NT-2000 can include high speed auto focus, an auto turret, and a computer-controlled stage in its fully automated production configuration.[1]

Not publicly documented

The following facts about the NT-2000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT-2000 are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the NT-2000 are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the NT-2000 are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the NT-2000 are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the NT-2000 is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (4)Every fact above is drawn from these public sources
  1. [1]web.archive.org — web.archive.orgweb.archive.org
  2. [2]web.archive.org — web.archive.orgweb.archive.org
  3. [3]Equipment inventory listing
  4. [4]Veeco Metrology Products by Name — web.archive.orgweb.archive.org
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Last updated Oct 5, 2026.

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