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Veeco

NT 3300 Optical

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Veeco / Wyko NT 3300 Optical is an optical 3D profiling system. The automated Wyko NT3300 is intended for measuring a wide variety of surfaces and samples, from optical-quality glass to microactuators. The NT 3300 supports VSI and PSI measurement modes.[1]

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What it is

The Veeco NT 3300 Optical Profilometer is an optical metrology and inspection instrument. The model designation is NT 3300.[2][3]

How it works

General reference — not yet source-verified

An optical profilometer measures surface topography without contact. The instrument uses reflected light and optical analysis to infer height variation across a sample surface.

An optical metrology tool in this class is used to extract film, step, and surface shape information from wafers and other precision parts. The noncontact method helps avoid probe-induced damage or wear on delicate surfaces.

Where it fits in the process flow

General reference — not yet source-verified

The Veeco NT 3300 Optical Profilometer fits in metrology and inspection rather than in pattern transfer or deposition. The instrument supports process control by checking surface conditions after fabrication steps that change topography.

A tool of this class is commonly used between process modules and final inspection. The instrument helps verify whether surfaces and structures remain within intended shape and thickness relationships before later manufacturing steps.

Applications

General reference — not yet source-verified

An optical profilometer is used for topography measurement on semiconductor surfaces and precision components. The class supports inspection of steps, roughness, and surface form in process control work.

What do the numbers mean?

Vacuum & pumping1

Measurement Modes
VSI (Vertical Scanning Interferometry) and PSI (Phase Shifting Interferometry)[1]
Accurate?

Wafer handling1

Wafer Size
8 inch[3]
Accurate?

Optics & imaging1

Type
Optical Profilometer / Optical 3D Profiling System[2]
Accurate?

Control & software1

Software
Vision 3.43[1]
Accurate?

Configuration & options2

Make
Veeco / Wyko[2]
Accurate?
Model
NT 3300[2]
Accurate?
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What does it need to run?

Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.

  • Measurement ModesVSI (Vertical Scanning Interferometry) and PSI (Phase Shifting Interferometry)[1]

Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What measurement modes does the NT 3300 support?

The NT 3300 supports Vertical Scanning Interferometry (VSI) and Phase Shifting Interferometry (PSI).[1]

Not publicly documented

The following facts about the NT 3300 Optical are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NT 3300 Optical are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the NT 3300 Optical are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the NT 3300 Optical are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the NT 3300 Optical are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the NT 3300 Optical is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (3)Every fact above is drawn from these public sources
  1. [1]manualslib.com — manualslib.commanualslib.com
  2. [2]Equipment inventory listing
  3. [3]Equipment inventory listing
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Last updated Oct 7, 2026.

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