Seiko Epson
The Seiko Epson NS 6040 is a high-speed IC handler. The NS 6040 automatically transports semiconductor devices and classifies them according to inspection results. The NS 6040 is part of the NS-6000 series of high speed IC handlers from Seiko Epson.[1][2]

The Seiko Epson NS 6040 is a semiconductor device handler, a type of automated test equipment used in the final stages of integrated circuit manufacturing. The NS 6040 is designed to handle and sort packaged integrated circuits during electrical testing. The Seiko Epson NS 6040 is a handler model produced by the Japanese manufacturer Seiko Epson Corporation.
Device handlers such as the NS 6040 transport packaged integrated circuits from input trays or tubes to a test site where electrical contact is made by a test socket and probe card connected to an external tester. The handler typically provides temperature control, enabling testing at elevated or lowered temperatures to characterize device performance under various thermal conditions. After testing, the handler sorts the devices into output bins based on test results, separating passing and failing units or binning by speed grade or other parametric criteria.
Device handlers operate in the final test area of a semiconductor fabrication facility or in an outsourced assembly and test (OSAT) facility. The process flow places the handler after wafer probe testing and after the dicing, die attach, wire bonding, and encapsulation steps that produce packaged integrated circuits. The handler feeds devices to a test head where functionality and parametric tests are performed. After testing, the handler sorts the devices into appropriate bins or output tubes, and the devices then proceed to tape-and-reel packaging, inspection, and shipment.
The Seiko Epson NS 6040 handler is used for final test of packaged integrated circuits in a production environment. The handler supports the testing of memory devices, logic devices, microcontrollers, and other semiconductor products that are supplied in standard package formats such as SOP, SSOP, TSSOP, QFP, and others that can be handled in tube or tray format. Dual temperature capability enables characterization of devices at both cold and hot extremes, which is important for automotive, industrial, and other applications requiring wide operating temperature ranges.
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The following facts about the NS 6040 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the NS 6040 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the NS 6040 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the NS 6040 are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the NS 6040 are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the NS 6040 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 8, 2026.