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Nanospec AFT 4000 Scanning UV Thickness Measurer

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This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

The Nanospec AFT 4000 is a scanning UV thickness measurer. The Nanospec AFT 4000 handles 8-inch wafers. The Nanospec AFT 4000 was manufactured in 1996.[1]

Onto InnovationNanospec AFT 4000 Scanning UV Thickness Measurer
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What is it?

The Nanospec AFT 4000 is a scanning UV thickness measurer that handles 8-inch wafers and was manufactured in 1996.

What do the numbers mean?

Wafer handling1

Wafer size
8 inch[1]
Accurate?

Configuration & options2

Measurement type
Scanning UV thickness measurement[1]
Accurate?
Vintage
1996[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What is the model designation of the tool?

The model designation is Nanospec AFT 4000.[1]

Not publicly documented

The following facts about the Nanospec AFT 4000 Scanning UV Thickness Measurer are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Nanospec AFT 4000 Scanning UV Thickness Measurer are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Nanospec AFT 4000 Scanning UV Thickness Measurer are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Nanospec AFT 4000 Scanning UV Thickness Measurer are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • No publicly documented failure modes or field errata for the Nanospec AFT 4000 Scanning UV Thickness Measurer are on record.

    Answerable by: a field service engineer, process engineer, or maintenance technician

  • The process node or technology generation of the Nanospec AFT 4000 Scanning UV Thickness Measurer is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

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Sources & citations

Sources (1)Every fact above is drawn from these public sources
  1. [1]Equipment inventory listing
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Last updated Sep 27, 2026.

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