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KLA

Surfscan 5500 Particle Defect

Metrology & InspectionKLA Surfscan family
Research Quality: 40% complete

Provisional entry — research in progress

This page was generated automatically from cited public sources and hasn't completed the full research pass yet. Every specification shown carries its source; more detail is added as research completes.

Surfscan 5500 Particle Defect — Inventory photo
Fig. 01Surfscan 5500 Particle DefectInventory photo[1]

What it is

The KLA Surfscan 5500 supports 200 mm (8-inch) wafers.[5]

Applications

General reference — not yet source-verified

Application areas include incoming wafer inspection, process development, and yield improvement studies. The system detects particles, scratches, and other surface anomalies on unpatterned wafers.

Why won't it start?

Documented failure modes, common issues, and field considerations.

  • non-working unit / parts machine

What do the numbers mean?

Wafer handling1

Wafer Size
8 inch[5]
Accurate?

Configuration & options3

Phase
1 Phase[1]
Accurate?
non-working unit / parts machine[5]
Accurate?
Vintage
1989, 1990[1]
Accurate?
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Where are the manuals?

Generated from public-source data on file. Enter your email to access — nothing is published; details are routed privately.

Not publicly documented

Field notes

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Frequently asked questions

What is the KLA Surfscan 5500?

It is a particle defect system from KLA.[1][2][5]

Not publicly documented

The following facts about the Surfscan 5500 Particle Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.

  • No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Surfscan 5500 Particle Defect are on record.

    Answerable by: OEM historical records or a trade-press announcement

  • No publicly documented variants, configuration options, or revision breakpoints of the Surfscan 5500 Particle Defect are on record.

    Answerable by: an OEM product catalog or an engineer who ordered or specified the tool

  • The control-system platform and OS era of the Surfscan 5500 Particle Defect are not on record.

    Answerable by: an engineer who operated it or OEM installation records

  • The process node or technology generation of the Surfscan 5500 Particle Defect is not on record.

    Answerable by: an OEM datasheet or a fab qualification report

  • No publicly documented compatible parts, consumables, or accessories for the Surfscan 5500 Particle Defect are on record.

    Answerable by: an OEM parts catalog or a service engineer

Sources & citations

Sources (5)Every fact above is drawn from these public sources
  1. [1]Inventory photo
  2. [2]Inventory photo
  3. [3]Inventory photo
  4. [4]Inventory photo
  5. [5]inventory listing
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Last updated Oct 2, 2026.

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