KLA
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The KLA Puma 9120 Defect is a dark-field defect inspection system used for detecting defects on semiconductor wafers. The KLA Puma 9120 Defect supports 200 mm and 300 mm wafers and uses visible and UV light (370-720 nm) with pixel sizes down to 0.16 μm.[1][2]
The KLA Puma 9120 Defect is used for dark field defect inspection on semiconductor wafers. The model is applied to surface defect detection and inspection of array and random defect patterns.[1][2][5]
The KLA Puma 9120 Defect is configured with pixel sizes of 0.16 μm, 0.20 μm, 0.25 μm, 0.39 μm, and 0.62 μm. The model supports Array Mode Algorithm, Sizing, and 9.1 Simulator options, and the model is not RICO capable.[2][5][1]
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The KLA Puma 9120 Defect is a dark field defect detection tool.[1]
The following facts about the Puma 9120 Defect are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Puma 9120 Defect are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Puma 9120 Defect are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Puma 9120 Defect are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Puma 9120 Defect are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Puma 9120 Defect is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Oct 8, 2026.
The KLA .204 PSL Wafer is an 8-inch NIST-traceable reference wafer compatible with Surfscan 6xy0 and Sp1 particle counters.
KLA .496 PSL Wafer is an 8-inch NIST traceable wafer stated to be capable on Surfscan 6xy0 and SP1.
The KLA .498 PSL Wafer is a NIST traceable reference wafer.