Agilent
The Agilent Medalist i 5000 ICT is an un-multiplexed in-circuit tester with a tester-per-pin architecture providing a 1:1 channel-to-node configuration. The Agilent Medalist i 5000 ICT uses a N1141 A test head, and the system is expandable toward a 5,184-node platform maximum.[1]

The Agilent Medalist i 5000 is an in-circuit tester produced by Agilent Technologies. The system uses a tester-per-pin architecture with one-to-one channel-to-node mapping and operates in an un-multiplexed configuration.[1]
An ICT applies analog stimulus and measures response through a dedicated set of test pins that contact specific nodes on the printed circuit board. The system can test passive components, diodes, transistors, and integrated circuits for correct placement and value, and can detect manufacturing defects such as solder bridges or missing parts.
The Medalist i 5000 is configured as a standalone system without an automated board handler, requiring manual board loading and unloading for each test cycle.[1]
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The Medalist i 5000 uses a tester-per-pin architecture with one-to-one channel-to-node mapping and operates in an un-multiplexed configuration.[1]
The system is expandable to a maximum platform size of 5,184 nodes.[1]
The system is standalone with no board handler, requiring manual board loading and unloading.[1]
The following facts about the Medalist i 5000 ICT are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the Medalist i 5000 ICT are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the Medalist i 5000 ICT are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the Medalist i 5000 ICT are not on record.
Answerable by: an engineer who operated it or OEM installation records
No publicly documented failure modes or field errata for the Medalist i 5000 ICT are on record.
Answerable by: a field service engineer, process engineer, or maintenance technician
The process node or technology generation of the Medalist i 5000 ICT is not on record.
Answerable by: an OEM datasheet or a fab qualification report
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Last updated Sep 22, 2026.
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