Advantest
The Advantest T 2000 is an open-architecture SoC test system that adopts the OPENSTAR standard. The T 2000 uses Microsoft Windows as its base operating system. The T 2000 supports test applications for digital consumer, MPU, RF, CMOS image sensor, and integrated power devices.[1]

The Advantest T2000 is a test system designed for system-on-chip (SoC) devices. The system adopts the OPENSTAR open architecture, allowing the integration of modules from different vendors. The T2000 runs on a Microsoft Windows operating system and uses C++ (Microsoft Visual Studio 2005 Professional Edition) for program development, with OTPL (Open Architecture Test Programming Language) as a test-program interface. The system includes an offline emulator, the T2000 System Software Emulator, and a suite of test tools such as Wave Tool (logic analyzer and oscilloscope functions), Shmoo, and Pattern Editor. The T2000 can be configured as an RF tester, equipped with modules including an SGM16 (Sync Gen/Matrix16), a 12GWSGA (12 GHz cellular/W-Lan Signal Generator/Analyzer), a DPS500 (500 mA Device Power Supply), an RC5V (Relay Control 5V), and a 2.5G Noise Source.[1][2]
The T2000 is used in the final test (FT) and wafer sort stages of semiconductor manufacturing. After wafer fabrication and before packaging, individual die are tested on a prober using the T2000. After packaging, packaged devices are tested in a handler or test socket. The system can also be used in characterization and engineering validation during the design phase.
Documented failure modes, common issues, and field considerations.
Site utility requirements, footprint, and infrastructure needed to install and operate this tool. Sourced from public records.
Tracked replaceable assemblies, spares criticality, and availability status across all major subsystems. Each entry cites its source.
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The T2000 uses Microsoft Windows as its base operating system.[1]
Yes, the T2000 can be configured as an RF tester, for example with an SGM16 sync gen/matrix, a 12GWSGA (12 GHz cellular/W-Lan signal generator/analyzer), and a 2.5G noise source.[2]
The T2000 supports test solutions for digital consumer products, microprocessors, RF devices, CMOS image sensors, integrated power devices, and an enhanced performance package.[1]
The following facts about the T 2000 are absent from this record as of this revision. First-hand knowledge or a citation closes a gap; every submission is reviewed before publication.
No publicly documented production dates or lifecycle milestones (introduction, end of production, EOL) for the T 2000 are on record.
Answerable by: OEM historical records or a trade-press announcement
No publicly documented variants, configuration options, or revision breakpoints of the T 2000 are on record.
Answerable by: an OEM product catalog or an engineer who ordered or specified the tool
The control-system platform and OS era of the T 2000 are not on record.
Answerable by: an engineer who operated it or OEM installation records
The process node or technology generation of the T 2000 is not on record.
Answerable by: an OEM datasheet or a fab qualification report
No publicly hosted manuals, SOPs, or datasheets for the T 2000 are on record.
Answerable by: university cleanroom staff or an OEM application specialist
Last updated Sep 29, 2026.