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The Nanometrics 210 is a film thickness measurement system capable of measuring film thicknesses up to 50 micrometers (500,000 angstroms) with a typical measurement time of 2.5 seconds.
The Nanometrics HL5500 is a Hall effect measurement system for measuring resistivity, carrier concentration, and mobility in semiconductors.
The Nanometrics / Accent HL 5500 PC is a Hall Effect Measurement System.
Nanometrics N2000 is a metrology software platform that supports Nanometrics 9000, 9100, 9200, and 9300 systems.