Waferpedia

Tool family

FormFactor CM 300 xi

FormFactor1 entry

Models in this family

  1. FormFactor CM 300 xi is a 300 mm semi-/fully-automated probe station for on-wafer testing.

    Cited variants

    DesignationGenerationVintageChangesSource
    CM300xi-ULN——Ultra low noise version for flicker noise, RTN or RTS, and phase noise measurements.formfactor.com[1]

Sources

Sources (1)Every fact above is drawn from these public sources
  1. [1]formfactor.comformfactor.com