Espec EHS-412(M)

Models in this family

1. EHS-412(M)

   The Espec EHS-412(M) is a large highly accelerated stress test system for semiconductor testing. The EHS-412(M) operates at +105.0°C to +162.2°C, 75%rh to 100%rh, and 0.019 to 0.389 MPa (gauge).

   Cited variants

   Designation	Generation	Vintage	Changes	Source
   EHS-212(M)	—	—	Lower temperature, humidity, and pressure range than EHS-412(M), with interior dimensions φ294×L318mm.	espec.co.jp[1]
   EHS-212MD	—	—	Two-stage version with interior dimensions φ294×L318mm ×2stage.	espec.co.jp[1]
   EHS-222(M)	—	—	Different chamber size, with interior dimensions φ394×L426mm.	espec.co.jp[1]
   EHS-222MD	—	—	Two-stage version with interior dimensions φ394×L426mm ×2stage.	espec.co.jp[1]
   EHS-222M-L	—	—	Longer chamber with interior dimensions φ394×L626mm.	espec.co.jp[1]
   EHS-412MD	—	—	Two-stage version with interior dimensions φ294×L318mm ×2stage.	espec.co.jp[1]

Sources