Comparison ledger
KLA 1007, Test Research Inc (TRI) TRI 518 FE MDA, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Inc (TRI) TRI 518 FE MDATest Research |
|---|---|---|
| OEM | KLA | Test Research |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Test Research Inc |
| Specifications | ||
| Manufacturer | KLA[1] | Test Research Inc (TRI)[4] |
| Model | 1007[1] | TRI 518 FE[4] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | 2005[4] |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Configuration | — | Computer NG, IDLE three years[3] |
| Type | — | MDA Tester (Manufacturing Defect Analyzer)[4] |
| Computer status | — | NG (not good)[3] |
| Idle duration | — | 3 years[4] |
| Computer state | — | IDLE[3] |
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