Comparison ledger
KLA 1007, Multitest InStrip, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | InStripMultitest |
|---|---|---|
| OEM | KLA | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Multitest InStrip |
| Cited variants | — |
|
| Specifications | ||
| Manufacturer | KLA[2] | — |
| Model | 1007[2] | — |
| Description | Wafer Prober[2] | — |
| Wafer size | 150 mm[2] | — |
| Convertible to 8 inch wafer size | Yes[2] | — |
| Vintage | 01.06.1995[2] | — |
| Make | KLA[3] | — |
| Equipment type | Prober[3] | — |
| Configuration | — | Inflip Module[4] |
| Conversion Kit | — | LGA14 3x5 / LGA 4x4 / LGA 5x5[7] |
| Type | — | Test handler for singulated devices[8] |
| Device handling | — | Carrier-based for singulated packages[8] |
| Multi-site testing | — | Yes (parallel testing of multiple devices)[8] |
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