Comparison ledger
KLA 1007, KLA 4PP-TypeF, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | 4PP-TypeFKLA |
|---|---|---|
| OEM | KLA | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | KLA 4PP-TypeF |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | 4PP-TypeF[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Probe spacing | — | 0.625mm[4] |
| Tip radius | — | 40um[4] |
| Force | — | 100gm[4] |
| Material | — | 230-0918[5] |
| Application | — | Metal measurement[4] |
| Compatible systems | — | Filmetrics R50 / R54[5] |
| Probe type | — | 4PP probe[4] |
| Spacing | — | 0.625 mm[4] |
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