Comparison ledger
Electroglas EG 4080, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | EG 4080Electroglas | 1007KLA |
|---|---|---|
| OEM | Electroglas | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Electroglas EG 4080 | KLA 1007 |
| Specifications | ||
| Configuration | DCM 4[1] | — |
| Temperature | Nickel Hot Chuck ( + 150°C )[1] | — |
| Wafer size | 8 inch[2] | 150 mm[3] |
| Hot chuck type | Nickel[1] | — |
| Maximum hot chuck temperature | +150°C[1] | — |
| Wafer reader | IOSS 120 (Barcode, OCR)[1] | — |
| Options included | DCM 4, DPS 3[1] | — |
| Manufacturer | — | KLA[3] |
| Model | — | 1007[3] |
| Description | — | Wafer Prober[3] |
| Convertible to 8 inch wafer size | — | Yes[3] |
| Vintage | — | 01.06.1995[3] |
| Make | — | KLA[4] |
| Equipment type | — | Prober[4] |
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