Waferpedia

Comparison ledger

103-754versusH150W

Cascade Microtech 103-754, Signatone H150W, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
103-754Cascade Microtech
H150WSignatone
OEMCascade MicrotechSignatone
CategoryTest & ProbeTest & Probe
Wafer size6-inch diameter microchamber and thermal chuck4-inch
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyCascade Microtech 103-754Signatone H150W
Specifications
typex-y-z-θ probe positioner[1]—
installed onHFTL 50-GHz Small-Signal Probe Station[1]—
quantity in stationtwo[1]—
station chuck size6-inch-diameter microchamber and thermal chuck[1]—
Quantity per stationTwo positioners[1]—
Chuck size6-inch-diameter microchamber and thermal chuck[1]—
Temperature range-50 to 200 °C[1]—
Model—H150W[2]
Type—Hybrid probe station[2]
Application—4-inch applications[2]
Chuck—4-inch, round, nickel plated chuck[2]
X-Y motion control—Manual X-Y motion control[2]
Theta adjustment—Manual theta adjustment[2]
Micropositioners—4 x S-725C#M micropositioners with X-Y-Z motion control[2]
Platen lift—Quick platen lift raises the probes off the device before moving the device in X or Y directions[2]
Microscope stage—4-inch, X-Y push microscope stage[2]
Microscope—SMZ143 Motic Stereozoom with built-in CCD port and 4:1 manual zoom[2]
Platen lift travel—Coarse, quick platen lift of 3/8"; fine platen lift of 1.25"[2]
Platen capacity—Holds up to 8 micropositioners[2]
Device hold-down—Vacuum toggle switch for device hold on chuck[2]
Warranty—1 year limited warranty[2]

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Sources (2)Every fact above is drawn from these public sources
  1. [1]cnf.cornell.educnf.cornell.edu
  2. [2]web.archive.orgweb.archive.org