Comparison ledger
Applied Materials 0010-03254 E Chuck, Keysight 4156 C Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-03254 E ChuckApplied Materials | |
|---|---|---|
| OEM | Applied Materials | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Keysight 41xx |
| Specifications | ||
| Configuration | — | 4x High-resolution SMU, 2xVSU and 2xVMU[1] |
| Add on | — | Agilent 41501B Pulse Generator Module[1] |
| Number of SMUs | — | 4[1] |
| Number of VSUs | — | 2[1] |
| Number of VMUs | — | 2[1] |
| Current measurement resolution | — | 1 femtoamp[1] |
| Voltage measurement resolution | — | 0.2 microvolt[1] |
| Maximum source voltage | — | +/-200 V[1] |
| Maximum source current | — | +/-1 A[1] |
| Pulse generator option | — | Optional 41501B Pulse Generator Module[1] |
| Software | — | Desktop EasyEXPERT[2] |
| Measurement functions | — | QSCV, Stress Mode, Knob-sweep, Stand-by[1] |
| Ground unit | — | 1.6A ground unit included in 41501B configurations[1] |
| Pre-defined application tests | — | Over 80 pre-defined, user-modifiable application tests[2] |