Comparison ledger
Advantest Q 8384 Optical Spectrum Analyzer, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | Q 8384 Optical Spectrum AnalyzerAdvantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest Q 8384 Optical Spectrum Analyzer | KLA 1007 |
| Specifications | ||
| Wavelength measurement range | 600 to 1700 nm[1] | — |
| Resolution bandwidth (settings) | 10 pm, 20 pm, 50 pm, 100 pm, 200 pm, 500 pm[1] | — |
| Wavelength accuracy (after built-in high source calibration, 1530-1570 nm) | ≤±20 pm[1] | — |
| Dynamic range | ≥50 dB (±0.1 nm), ≥60 dB (±0.2 nm), ≥67 dB (±0.4 nm, high dynamic range mode)[1] | — |
| Level measurement range | -87 to +23 dBm (1250-1610 nm), -77 to +23 dBm (950-1250, 1610-1700 nm), -55 to +23 dBm (600-1000 nm)[1] | — |
| Level accuracy | ≤±0.4 dB (1550 nm)[1] | — |
| Polarization dependency | ≤±0.05 dB (1250-1610 nm)[1] | — |
| Wavelength repeatability | ≤±3 pm (1530-1610 nm)[1] | — |
| Sweep time | ≤500 ms (Span 10 nm, Normal Mode, 1550 nm, average 1 time, 501 samples)[1] | — |
| Optical input fiber | 9.5/125 μm SM fiber[1] | — |
| Mass | 29 kg or less[1] | — |
| Dimensions (W x H x D) | Approx. 424 x 221 x 500 mm[1] | — |
| Power requirements | AC100-120 V / 220-240 V, 50/60 Hz, 200 VA or less[1] | — |
| Operating temperature | +10 to +40°C[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →