Comparison ledger
Accretech UF 3000 LX Automatic Wafer, Cascade Microtech 103-754, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | UF 3000 LX Automatic WaferAccretech | 103-754Cascade Microtech |
|---|---|---|
| OEM | Accretech | Cascade Microtech |
| Category | Test & Probe | Test & Probe |
| Wafer size | Wafer I.D Reading | 6-inch diameter microchamber and thermal chuck |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Accretech UF 3000 | Cascade Microtech 103-754 |
| Specifications | ||
| Configuration | Room/hot chuck[1] | — |
| Wafer size | Wafer I.D Reading[2] | — |
| type | — | x-y-z-θ probe positioner[3] |
| installed on | — | HFTL 50-GHz Small-Signal Probe Station[3] |
| quantity in station | — | two[3] |
| station chuck size | — | 6-inch-diameter microchamber and thermal chuck[3] |
| Quantity per station | — | Two positioners[3] |
| Chuck size | — | 6-inch-diameter microchamber and thermal chuck[3] |
| Temperature range | — | -50 to 200 °C[3] |
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