Teradyne
Nextest Magnum 1 PV alternatives
Comparable Test & Probe equipment documented in the Waferpedia catalog.
6 comparable tools
Advantest
93000 SOC
Test & Probe
The Advantest 93000 SOC Tester is a system-on-chip tester referenced in sources with multiple configurations of infrared, digital, DC, and AC modules.
LTX-Credence
Fusion HFT
Test & Probe
The LTX-Credence Fusion HFT is a configurable semiconductor tester used for device testing in production and NPI development.
Advantest
T 5503 HS
Test & Probe
The Advantest T5503HS is a high-speed memory test system designed for testing DDR4 and LPDDR4 SDRAMs.
Advantest
V 93000 PS 1600
Test & Probe
The Advantest V 93000 PS 1600 is a tester with an ATH (Advanced Test Head) configuration.
Applied Materials
0720 06060 Part
Test & Probe
KLA
1007
Test & Probe
The KLA 1007 is a wafer prober manufactured by KLA.
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