Waferpedia

Comparison ledger

4PP-TypeFversus1070

KLA 4PP-TypeF, Signatone 1070, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
1070Signatone
OEMKLASignatone
CategoryTest & ProbeTest & Probe
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyKLA 4PP-TypeFSignatone 1070
Specifications
Model4PP-TypeF[1]1070[4]
Probe spacing0.625mm[2]—
Tip radius40um[2]—
Force100gm[2]—
Material230-0918[3]—
ApplicationMetal measurement[2]—
Compatible systemsFilmetrics R50 / R54[3]—
Probe type4PP probe[2]—
Spacing0.625 mm[2]—
Make—Signatone[4]

Plan your fab

Building a Test & Probe process? Get a complete equipment list.

Open the fab equipment planner →
Sources (4)Every fact above is drawn from these public sources
  1. [1]store.kla-instruments.comstore.kla-instruments.com
  2. [2]cntech.co.ukcntech.co.uk
  3. [3]store.kla-instruments.comstore.kla-instruments.com
  4. [4]Equipment inventory listing