Comparison ledger
KLA .498 PSL Wafer, Olympus MPLN 50 X Microscope Objective Lens, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | KLA | Olympus |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .498 PSL Wafer | Olympus MPLN |
| Specifications | ||
| Configuration | NIST Traceable[1] | 50x Magnification[2] |
| NIST traceability | Yes[1] | — |
| Numerical Aperture (NA) | — | 0.75[2] |
| Manufacturer | — | Olympus[2] |
| Model | — | MPLN 50 X[2] |
| Magnification | — | 50x[2] |
| Numerical aperture | — | 0.75[2] |
| Optical type | — | Microscope objective lens[2] |
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