Comparison ledger
KLA .496 PSL Wafer, Onto Innovation NSX 105 Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NSX 105 WaferOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA .496 PSL Wafer | Onto Innovation NSX 105 |
| Specifications | ||
| Configuration | NIST Traceable[1] | X_Stage encoder issues[3] |
| Wafer size | 8 inch[1] | 300 mm[5] |
| Traceability | NIST Traceable[1] | — |
| Compatible systems | Capable on Surfscan 6xy0 and SP1[1] | — |
| Category | Metrology & Inspection[2] | Metrology & Inspection[4] |
| Manufacturer | — | Onto Innovation[4] |
| Model | — | NSX 105 Wafer[4] |
| Inspection type | — | Macro defect inspection system[5] |
| Alternate designation | — | NSX 105 Macro Defect[5] |
| Issue noted | — | X_Stage encoder issues[3] |
| Missing parts | — | NSK Controller; Matrox PC; 24 Volt PS Stage[3] |
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