Comparison ledger
KLA 1007, Signatone H150W, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | H150WSignatone |
|---|---|---|
| OEM | KLA | Signatone |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | 4-inch |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | Signatone H150W |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | H150W[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | — |
| Equipment type | Prober[2] | — |
| Type | — | Hybrid probe station[3] |
| Application | — | 4-inch applications[3] |
| Chuck | — | 4-inch, round, nickel plated chuck[3] |
| X-Y motion control | — | Manual X-Y motion control[3] |
| Theta adjustment | — | Manual theta adjustment[3] |
| Micropositioners | — | 4 x S-725C#M micropositioners with X-Y-Z motion control[3] |
| Platen lift | — | Quick platen lift raises the probes off the device before moving the device in X or Y directions[3] |
| Microscope stage | — | 4-inch, X-Y push microscope stage[3] |
| Microscope | — | SMZ143 Motic Stereozoom with built-in CCD port and 4:1 manual zoom[3] |
| Platen lift travel | — | Coarse, quick platen lift of 3/8"; fine platen lift of 1.25"[3] |
| Platen capacity | — | Holds up to 8 micropositioners[3] |
| Device hold-down | — | Vacuum toggle switch for device hold on chuck[3] |
| Warranty | — | 1 year limited warranty[3] |
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