Comparison ledger
KLA 1007, LTX-Credence Fusion LX, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | Fusion LXLTX-Credence |
|---|---|---|
| OEM | KLA | LTX-Credence |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | 2006– |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 1007 | LTX-Credence Fusion LX |
| Specifications | ||
| Manufacturer | KLA[1] | — |
| Model | 1007[1] | Fusion LX[3] |
| Description | Wafer Prober[1] | — |
| Wafer size | 150 mm[1] | — |
| Convertible to 8 inch wafer size | Yes[1] | — |
| Vintage | 01.06.1995[1] | — |
| Make | KLA[2] | LTX / Credence[3] |
| Equipment type | Prober[2] | — |
| Category | — | Test & Probe[4] |
| Instrument slots | — | 20[5] |
| Digital pins | — | 128[5] |
| Capabilities | — | X-Series full range of DSP, DC and power capabilities[6] |
| System type | — | Test system[5] |
| X-Series capabilities | — | DSP, DC, and power capabilities[5] |
| Loadboard interface | — | direct loadboard interface[5] |
| Mainframe requirement | — | does not require a mainframe[5] |
| Control platform | — | Linux based PC tester controller[5] |
| Production capability | — | complete production solution[5] |
| Digital performance | — | up to 400Mb/s[5] |
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