Comparison ledger
KLA 0035235-003 MMD Head, Onto Innovation NSX 105 Wafer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | NSX 105 WaferOnto Innovation | |
|---|---|---|
| OEM | KLA | Onto Innovation |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | Onto Innovation NSX 105 |
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[1] | X_Stage encoder issues[2] |
| Model | 0035235-003[1] | NSX 105 Wafer[3] |
| Make | KLA[1] | — |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[1] | — |
| Compatible System | KLA AIT-XP[1] | — |
| Manufacturer | — | Onto Innovation[3] |
| Category | — | Metrology & Inspection[3] |
| Wafer size | — | 300 mm[4] |
| Inspection type | — | Macro defect inspection system[4] |
| Alternate designation | — | NSX 105 Macro Defect[4] |
| Issue noted | — | X_Stage encoder issues[2] |
| Missing parts | — | NSK Controller; Matrox PC; 24 Volt PS Stage[2] |
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