Comparison ledger
KLA 0035235-003 MMD Head, KLA 2351, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 2351KLA | |
|---|---|---|
| OEM | KLA | KLA |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | Wafer Transfer System |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | KLA 0035235-003 MMD Head | KLA 2351 |
| Specifications | ||
| Configuration | TSTD PCB ASSY, MMD MEAS HEAD[1] | With HDD & Software[2] |
| Model | 0035235-003[1] | 2351[2] |
| Make | KLA[1] | KLA[2] |
| Part Description | TSTD PCB ASSY, MMD MEAS HEAD[1] | — |
| Compatible System | KLA AIT-XP[1] | — |
| Load Port Qty | — | 2[2] |
| Wavelength Illumination | — | 370~720 nm[2] |
| Wavelength Band | — | Visible, UV[2] |
| Pixel Size | — | 0.16μm / 0.20μm / 0.25μm / 0.39μm / 0.62μm[2] |
| Array Defect Capture Rate | — | ≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[2] |
| Array False Defect Rate | — | ≤1.5%(all sizes)[2] |
| Random Defect Capture Rate | — | ≥90% (0.16 um, 0.20 um, 0.25 um, 0.39 um, 0.62 um sensitivities)[2] |
| Random False Defect Rate | — | ≤1.5% (all sizes)[2] |
| Repeatability | — | ≥90% (20 consecutive run on the same DSW wafer)[2] |
| Wafer size | — | Wafer Transfer System[2] |
| Wafer Sizes | — | 8 inch; 12 inch[3] |
| Pixel Sizes | — | 0.16μm / 0.20μm / 0.25μm / 0.39μm / 0.62μm[2] |
| Vintage | — | 2002[2] |
| Illumination Wavelength | — | 370~720 nm[2] |
| Load Port Quantity | — | 2[2] |
| User Interface | — | Monitor, Workstation, Keyboard, Trackball, Joystick[2] |
| Main Body Components | — | Inspection Station, Wafer Transfer System, Stage[2] |
| Includes | — | HDD & Software, External Blower, Power Line Conditioner[2] |
| Main Body | — | Inspection Station; Wafer Transfer System; Stage[2] |
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