Comparison ledger
JDSU T BERD 6000 A Network Test Platform, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 1007KLA | |
|---|---|---|
| OEM | JDSU | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | KLA 1007 |
| Specifications | ||
| Platform type | Compact network test platform[1] | — |
| Display | 8.4 inch transreflective touchscreen color display[1] | — |
| Internal memory | up to 1 gigabyte[1] | — |
| Battery | High-capacity Lithium-ion battery, 11-hour battery life[1] | — |
| Number of module slots | 1[1] | — |
| Built-in functions | Visual fault locator, power meter, loss test set, optical return loss test, video inspection scope[1] | — |
| Supported Ethernet rates | 10 Mb/s to 10 GigE (LAN-PHY and WAN-PHY)[1] | — |
| Supported SONET/SDH rates | OC-3/STM-1 through OC-192/STM-64[1] | — |
| OTDR dynamic range | up to 50 dB (at 1550 nm for UHD module)[1] | — |
| OTDR dead zone | 0.5 m (multimode), 0.8 m (singlemode)[1] | — |
| Ports | 2 USB ports, 1 high-speed Ethernet port[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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