Comparison ledger
Applied Materials 0720 06060 Part, Multitest InStrip, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0720 06060 PartApplied Materials | InStripMultitest |
|---|---|---|
| OEM | Applied Materials | Multitest |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0720 06060 Part | Multitest InStrip |
| Cited variants | — |
|
| Specifications | ||
| Configuration | Contact Pin 24-20 Awg Crimp Gold Flash[2] | Inflip Module[3] |
| Conversion Kit | — | LGA14 3x5 / LGA 4x4 / LGA 5x5[6] |
| Type | — | Test handler for singulated devices[7] |
| Device handling | — | Carrier-based for singulated packages[7] |
| Multi-site testing | — | Yes (parallel testing of multiple devices)[7] |
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