Comparison ledger
Applied Materials 0010-21246 Part, Onto Innovation Nanospec AFT 4150 Thin Film Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-21246 PartApplied Materials | Nanospec AFT 4150 Thin Film MeasurementOnto Innovation |
|---|---|---|
| OEM | Applied Materials | Onto Innovation |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | — | Onto Innovation Nanospec AFT |
| Cited variants | — |
|
| Specifications | ||
| Configuration | — | Parts machine[2] |
| Measurement type | — | Visible light film thickness (reflectometry)[1] |
| Power | — | 15VDC[1] |
| Manufacture date | — | June 06, 1996[1] |
| Country of manufacture | — | USA[1] |
| Optical head part number | — | 7200-1821 Rev B[1] |
| Rear connectors | — | DB-15 female (x2), BNC (x1)[1] |
| Enclosure | — | Black anodized aluminum optical bench on mounting base plate, with cream-colored outer housing[1] |
| Internal assembly | — | Motorized gear drive mechanism, adjustable mirror/lens mounts, circular objective lens port with internal optical detector[1] |
| Measured film thickness range | — | Tens to thousands of angstroms (for oxide and nitride films)[1] |
| Vintage | — | 1996[2] |