Comparison ledger
Applied Materials 0010-18024 Pyrometer Assembly, Applied Materials SEMVision G 3 Lite DR-SEM, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | 0010-18024 Pyrometer AssemblyApplied Materials | SEMVision G 3 Lite DR-SEMApplied Materials |
|---|---|---|
| OEM | Applied Materials | Applied Materials |
| Category | Metrology & Inspection | Metrology & Inspection |
| Wafer size | — | Wafer rotation option |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Applied Materials 0010-18024 Pyrometer Assembly | Applied Materials SEMVision |
| Specifications | ||
| Configuration | Capable of working on Applied Materials Radiance[1] | EDX option[2] |
| Software version | — | 5.3.100[2] |
| Loader | — | 3 TDK ADO with RFID[2] |
| Robot | — | Brooks, single blade with through beam mapper[2] |
| SEM system | — | G3 column (FEI / Denka tip)[2] |
| Optical systsem | — | OM with 5x, 20x, 100x[2] |
| Wafer size | — | Wafer rotation option[2] |
| Stage wafer holder | — | electrostatic chuck[2] |
| OEM | — | Applied Materials[2] |
| Model | — | SEMVision G 3 Lite DR-SEM[2] |
| Category | — | Metrology & Inspection[3] |
| Tool type | — | Defect review scanning electron microscope[2] |
| Optical system | — | OM with 5x, 20x, 100x[2] |
| EDX option | — | Present[2] |
| Tilt option | — | Present[2] |
| Wafer rotation option | — | Present[2] |
| Condition | — | Fully refurbished[2] |
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