Waferpedia

Comparison ledger

11980 Aversus6000

Agilent 11980 A, Wyko 6000, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
11980 AAgilent
6000Wyko
OEMAgilentWyko
CategoryPrecision OpticsPrecision Optics
Wafer size——
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAgilent 11980 AWyko 6000
Specifications
Wavelength Range1250-1600 nm[1]—
Configuration—Fizeau configuration[2]
Test beam diameter—152 mm (6 in.)[2]
Accuracy (peak-to-valley)—better than 1/100[2]
Repeatability—surpasses 1/1000[2]
Optional dual-beam system—two channels for wider range of optics testing[2]
Dual-beam large optics channel—152 mm (6 in.) beam[2]
Dual-beam small optics channel—44 mm (1.75 in.) beam[2]
Zoom—full 6X zoom[2]
Software—user-friendly software[2]
Type—laser interferometer[3]
Pass/fail display—prominent display of pass/fail results[3]
Aberration removal—user-selectable removal of aberration[3]
Accuracy—peak-to-valley accuracy better than /100[3]
Optional dual-beam large optics channel—152 mm (6 in.) beam[3]
Optional dual-beam small optics channel—44 mm (1.75 in.) beam[3]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]waferpedia.comwaferpedia.com
  2. [2]web.archive.orgweb.archive.org
  3. [3]web.archive.orgweb.archive.org