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11980 A Fiber OpticversusMetaPulse 200 XCu Metal Film Measurement

Agilent 11980 A Fiber Optic, Onto Innovation MetaPulse 200 XCu Metal Film Measurement, side by side. Every value shown is drawn from the cited encyclopedia entries.

Side-by-side comparison of selected equipment models
Attribute
OEMAgilentOnto Innovation
CategoryPrecision OpticsPrecision Optics
Wafer size—Wafer Mapping
Process node——
Introduced——
Production run——
Lifecycle——
Lifecycle milestones——
Control system——
Generation——
FamilyAgilent 11980 A Fiber OpticOnto Innovation MetaPulse 200
Specifications
Configuration1250-1600nm[1]Non copper tool; double path tool delay stage[2]
Wavelength Range1250-1600nm[1]—
Cooling Water Required Minimum Flow—0.79 GPM (3.00 l/m)[2]
Min Temp—12 *C (54 *F, 285.00 *K)[2]
Max Temp—20 *C (68 *F, 293 *K)[2]
Wafer size—Wafer Mapping[2]
Controller Type—PC Controller[2]
External Cooling—Water Cooled[2]
Cooling Water Required—Minimum Flow: 0.79 GPM (3.00 l/m) Min Temp: 12 *C (54 *F, 285.00 *K) Max Temp: 20 *C (68 *F, 293 *K)[2]
Operating Air Pressure—14.00 PSI (96,534.20 N/sq m)[2]
Vacuum Required—0.98 in Hg (24.89 mm Hg)[2]

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Sources (3)Every fact above is drawn from these public sources
  1. [1]inventory listing
  2. [2]inventory listing
  3. [3]inventory listing