Comparison ledger
Advantest M 6242, KLA 1007, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | M 6242Advantest | 1007KLA |
|---|---|---|
| OEM | Advantest | KLA |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest M 6242 | KLA 1007 |
| Specifications | ||
| Configuration | 50 / 60 Hz[1] | — |
| Target Packages | BGA, CSP, TSOP 1[1] | — |
| Simultaneous Testing | Up to 512 devices[1] | — |
| Throughput | 42,300 devices per hour[1] | — |
| Temperature Range | -40°C to 125°C, -55°C to 125°C (optional)[1] | — |
| Match Plate | Advantest Standard Type[1] | — |
| Manufacturer | — | KLA[2] |
| Model | — | 1007[2] |
| Description | — | Wafer Prober[2] |
| Wafer size | — | 150 mm[2] |
| Convertible to 8 inch wafer size | — | Yes[2] |
| Vintage | — | 01.06.1995[2] |
| Make | — | KLA[3] |
| Equipment type | — | Prober[3] |
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