Comparison ledger
Advantest C 400 E, Teradyne Nextest Magnum 1 SV, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | C 400 EAdvantest | Nextest Magnum 1 SVTeradyne |
|---|---|---|
| OEM | Advantest | Teradyne |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest C 400 E | Teradyne Nextest Magnum |
| Specifications | ||
| Configuration | 512 pins[2] | CA Type[5] |
| C400e 56M | 25[2] | — |
| P1000-56M | 7[2] | — |
| GPDPS | 4[2] | — |
| MSDPS | 0[2] | — |
| Analog | MCA: 1[2] | — |
| AC/DC Converter | 8[3] | — |
| DC/DC (Analog) | 1[3] | — |
| DPS Power | GPDPS 1,2,3,4[4] | — |
| P100-112M | 2[4] | — |
| Manufacturer | Advantest[3] | — |
| Model | C 400 E[3] | Nextest Magnum 1 SV[6] |
| Category | Test & Probe[3] | Test & Probe[1] |
| Digital Configure | 10101-10216 | P1000 I 2M | 56M |; 10301-10516 | C400e I 2M | 56M |; 10601-10616 | P1000 I 2M | 56M |; 10701-10816 | C400e I 2M | 56M |; 10901-11216 | P1000 I 2M | 56M |; 11301-13216 | C400e I 2M | 56M |[2] | — |
| Testhead | LTH[2] | — |
| Cooler Type | E2760FA[2] | — |
| HPIB | 1/0[2] | — |
| IP Address | 10.20.41.117[2] | — |
| Area | 4F-CP[2] | — |
| Digital Configure Count | C400e 56M: 25; P1000-56M: 7[3] | — |
| DPS Power Count | GPDPS: 4; MSDPS: 0[3] | — |
| Analog Count | MCA: 1[3] | — |
| Device count | 512 pins[2] | — |
| PN | — | 508540 test boards (10)[5] |
| OEM | — | Teradyne[6] |
| Test boards | — | PN 508540 test boards (10)[5] |
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