Comparison ledger
Advantest C 400 E, Applied Materials 0720 06060 Part, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | C 400 EAdvantest | 0720 06060 PartApplied Materials |
|---|---|---|
| OEM | Advantest | Applied Materials |
| Category | Test & Probe | Test & Probe |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | Advantest C 400 E | Applied Materials 0720 06060 Part |
| Specifications | ||
| Configuration | 512 pins[1] | Contact Pin 24-20 Awg Crimp Gold Flash[4] |
| C400e 56M | 25[1] | — |
| P1000-56M | 7[1] | — |
| GPDPS | 4[1] | — |
| MSDPS | 0[1] | — |
| Analog | MCA: 1[1] | — |
| AC/DC Converter | 8[2] | — |
| DC/DC (Analog) | 1[2] | — |
| DPS Power | GPDPS 1,2,3,4[3] | — |
| P100-112M | 2[3] | — |
| Manufacturer | Advantest[2] | — |
| Model | C 400 E[2] | — |
| Category | Test & Probe[2] | — |
| Digital Configure | 10101-10216 | P1000 I 2M | 56M |; 10301-10516 | C400e I 2M | 56M |; 10601-10616 | P1000 I 2M | 56M |; 10701-10816 | C400e I 2M | 56M |; 10901-11216 | P1000 I 2M | 56M |; 11301-13216 | C400e I 2M | 56M |[1] | — |
| Testhead | LTH[1] | — |
| Cooler Type | E2760FA[1] | — |
| HPIB | 1/0[1] | — |
| IP Address | 10.20.41.117[1] | — |
| Area | 4F-CP[1] | — |
| Digital Configure Count | C400e 56M: 25; P1000-56M: 7[2] | — |
| DPS Power Count | GPDPS: 4; MSDPS: 0[2] | — |
| Analog Count | MCA: 1[2] | — |
| Device count | 512 pins[1] | — |
Plan your fab
Building a Test & Probe process? Get a complete equipment list.
Open the fab equipment planner →