Comparison ledger
ABM -407B-2-S-CE-S293 Robot, Keysight 4156 C Semiconductor Parameter Analyzer, side by side. Every value shown is drawn from the cited encyclopedia entries.
| Attribute | ||
|---|---|---|
| OEM | ABM | Keysight |
| Category | — | — |
| Wafer size | — | — |
| Process node | — | — |
| Introduced | — | — |
| Production run | — | — |
| Lifecycle | — | — |
| Lifecycle milestones | — | — |
| Control system | — | — |
| Generation | — | — |
| Family | ABM -407B-2-S-CE-S293 Robot | Keysight 41xx |
| Specifications | ||
| Model | ABM-407B-2-S-CE-S293[1] | — |
| Description | ROBOT[1] | — |
| Refurbished RTP RTA | AG Associates 4100, 4108, 8108, 8800, 8800i,210, 310, 410, 610, 610I, MPT RTP-600S, 800S, RTP-3000[1] | — |
| KLA-Tencor Spare Parts and Service | RS-35C,RS-55,RS-75,RS-100,UV-1050,UV-1080,UV-1250,UV-1280,ASET F5 / F5X,AIT Systems,HRP-220 Stylus Profiler[1] | — |
| Refurbished Isotropic Plasma Etcher | Matrix, Tegal, Lam Research, Branson/IPC, PlasmaTherm[1] | — |
| Refurbished PECVD, ALD Equipment | Cambridge, Oxford PlasmaLab , Plasma-Therm, STS/SPTS, AMAT[1] | — |
| Refurbished Mask Aligner | Canon Neutronix PLA501/545, Suss MA200CC, MA8BA8 GEN3, MA8BA8 GEN2, MA8BA8, MA200E[1] | — |
| Refurbished Bonding | SUSS SB6E, SUSS SB8E, EVG 620 BA, EVG EV501, West Bond 7200AR 7400A[1] | — |
| Refurbished Wafer Prober | Electroglas EG 4090u+, EG 4090, EG 2001X, EG 1034X, Cascade PS-21[1] | — |
| Configuration | — | 4x High-resolution SMU, 2xVSU and 2xVMU[2] |
| Add on | — | Agilent 41501B Pulse Generator Module[2] |
| Number of SMUs | — | 4[2] |
| Number of VSUs | — | 2[2] |
| Number of VMUs | — | 2[2] |
| Current measurement resolution | — | 1 femtoamp[2] |
| Voltage measurement resolution | — | 0.2 microvolt[2] |
| Maximum source voltage | — | +/-200 V[2] |
| Maximum source current | — | +/-1 A[2] |
| Pulse generator option | — | Optional 41501B Pulse Generator Module[2] |
| Software | — | Desktop EasyEXPERT[3] |
| Measurement functions | — | QSCV, Stress Mode, Knob-sweep, Stand-by[2] |
| Ground unit | — | 1.6A ground unit included in 41501B configurations[2] |
| Pre-defined application tests | — | Over 80 pre-defined, user-modifiable application tests[3] |